SN74BCT8374ADWR
- Description：
- IC SCAN TEST DEVICE W/FF 24-SOIC
- Manufacturer：
- Texas Instruments
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Product Information
- Category
- Logic - Specialty Logic
- Packaging
- Tape & Reel (TR)
- Series
- 74BCT
- Logic Type
- Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Supply Voltage
- 4.5 V ~ 5.5 V
- Number of Bits
- 8
- Operating Temperature
- 0°C ~ 70°C
- Mounting Type
- Surface Mount
- Package / Case
- 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package
- 24-SOIC
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