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74ABTH182646APMG4

Description:
IC 18BIT SCAN TEST DEV 64-LQFP
Manufacturer:
Texas Instruments
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74ABTH182646APMG4

Product Information

Category
Logic - Specialty Logic
Packaging
Tray
Series
74ABTH
Logic Type
Scan Test Device With Transceivers And Registers
Supply Voltage
4.5 V ~ 5.5 V
Number of Bits
18
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
64-LQFP
Supplier Device Package
64-LQFP (10x10)

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