SN74LVTH18646APMG4
- Description：
- IC SCAN-TEST-DEV/XCVR 64-LQFP
- Manufacturer：
- Texas Instruments
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Product Information
- Category
- Logic - Specialty Logic
- Packaging
- Tray
- Series
- 74LVTH
- Logic Type
- ABT Scan Test Device With Transceivers and Registers
- Supply Voltage
- 2.7 V ~ 3.6 V
- Number of Bits
- 18
- Operating Temperature
- -40°C ~ 85°C
- Mounting Type
- Surface Mount
- Package / Case
- 64-LQFP
- Supplier Device Package
- 64-LQFP (10x10)
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