SN74BCT8373ANTE4
- Description：
- IC SCAN TEST DEVICE LATCH 24-DIP
- Manufacturer：
- Texas Instruments
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Product Information
- Category
- Logic - Specialty Logic
- Packaging
- Tube
- Series
- 74BCT
- Logic Type
- Scan Test Device with D-Type Latches
- Supply Voltage
- 4.5 V ~ 5.5 V
- Number of Bits
- 8
- Operating Temperature
- 0°C ~ 70°C
- Mounting Type
- Through Hole
- Package / Case
- 24-DIP (0.300", 7.62mm)
- Supplier Device Package
- 24-PDIP
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