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Part Number |
Manufacturer |
Description |
Packaging | Series | Logic Type | Supply Voltage | Number of Bits | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package |
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SN74LVT8986ZGV |
Texas Instruments |
IC LINK ADDRSS SCAN-PORT 64-BGA |
Tray | 74LVT | Linking Addressable Scan Ports | 2.7 V ~ 3.6 V | - | -40°C ~ 85°C | Surface Mount | 64-LFBGA | 64-BGA MICROSTAR (8x8) |
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SN74LVTH18502APMG4 |
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Tray | 74LVTH | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74LVTH18504APMG4 |
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Tray | 74LVTH | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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74LVTH182502APMG4 |
Texas Instruments |
IC 18BIT UNIV BUS TXRX 64-LQFP |
Tray | 74LVTH | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74BCT8240ADWE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Tube | 74BCT | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8373ADW |
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
Tube | 74BCT | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8373ADWE4 |
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
Tube | 74BCT | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8240ADWG4 |
Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
Tube | 74BCT | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8373ADWG4 |
Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
Tube | 74BCT | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8374ADWE4 |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
Tube | 74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8374ADWG4 |
Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
Tube | 74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74LVT8980ADW |
Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
Tube | 74LVT | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74LVT8996DW |
Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
Tube | 74LVT | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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CLVT8996DWG4 |
Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
Tube | 74LVT | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74ABT8996DW |
Texas Instruments |
IC ADDRESSABLE SCAN PORT 24-SOIC |
Tube | 74ABT | Addressable Scan Ports | 4.5 V ~ 5.5 V | 10 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 160-NFBGA (9x13) |
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SN74ACT8997DW |
Texas Instruments |
IC SCAN-PATH LINKER 28-SOIC |
Tube | 74ACT | SCAN-PATH LINKERS | 4.5 V ~ 5.5 V | 4 | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74ABT8996PW |
Texas Instruments |
IC ADDRESSABLE SCAN PORT 24TSSOP |
Tube | 74ABT | Addressable Scan Ports | 4.5 V ~ 5.5 V | 10 | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP |
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SN74ABTH16460DLG4 |
Texas Instruments |
IC REGISTERED TRANSCVR 56SSOP |
Tube | 74ABTH | 4-TO-1 Multiplexed/Demultiplexed Transceivers | 4.75 V ~ 5.5 V | 5 | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP |
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SN74SSTV32877GKER |
Texas Instruments |
IC REGISTERED BUFF 26BIT 96LFBGA |
Tape & Reel (TR) | 74SSTV | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 26 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-LFBGA (13.5x5.5) |
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SN74SSTV32877GKER |
Texas Instruments |
IC REGISTERED BUFF 26BIT 96LFBGA |
Cut Tape (CT) | 74SSTV | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 26 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-LFBGA (13.5x5.5) |
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SN74BCT8244ADW |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Tube | 74BCT | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8244ADWE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
Tube | 74BCT | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8245ADW |
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-SOIC |
Tube | 74BCT | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8245ADWE4 |
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-SOIC |
Tube | 74BCT | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8244ADWG4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24SOIC |
Tube | 74BCT | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74BCT8245ADWG4 |
Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
Tube | 74BCT | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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SN74LVT8986GGV |
Texas Instruments |
IC LINK ADDRSS SCAN-PORT 64-BGA |
Tube | 74LVT | Linking Addressable Scan Ports | 2.7 V ~ 3.6 V | - | -40°C ~ 85°C | Surface Mount | 64-LFBGA | 64-BGA MICROSTAR (8x8) |
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SN74ABT8646DLG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
Tube | 74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
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SN74ABT8646DWE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
Tube | 74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74ABT8646DWG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28SOIC |
Tube | 74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74FB2033ARCRG3 |
Texas Instruments |
IC REGISTERED TXRX 8BIT 52QFP |
Tape & Reel (TR) | 74FB | TTL/BTL Registered Transceiver | 4.75 V ~ 5.25 V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
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SN74BCT8244ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
Tube | 74BCT | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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SN74BCT8373ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24-DIP |
Tube | 74BCT | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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SN74ABT18245ADL |
Texas Instruments |
IC SCAN-TEST-DEV/TXRX 56-SSOP |
Tube | 74ABT | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP |
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SN74ABT18245ADLG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 56SSOP |
Tube | 74ABT | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP |
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SN74ABTE16245DLG4 |
Texas Instruments |
IC 16BIT I-WS BUS TXRX 48-SSOP |
Tube | 74ABTE | Incident-Wave Switching Bus Transceivers | 4.5 V ~ 5.5 V | 16 | -40°C ~ 85°C | Surface Mount | 48-BSSOP (0.295", 7.50mm Width) | 48-SSOP |
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SN74ABT8543DWE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
Tube | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74ABT8652DWE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
Tube | 74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74ABT8952DWE4 |
Texas Instruments |
IC SCAN TESST DEVICE 28-SOIC |
Tube | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74ABT8543DWG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28SOIC |
Tube | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74ABT8652DWG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28SOIC |
Tube | 74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74ABT8952DWG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28SOIC |
Tube | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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SN74ABT18640DLG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 56SSOP |
Tube | 74ABT | Scan Test Device with Inverting Bus Transceivers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP |
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SN74ABT8543DLG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
Tube | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
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SN74ABT8652DLG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
Tube | 74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
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SN74ABT8952DLG4 |
Texas Instruments |
IC SCAN TESST DEVICE 28-SSOP |
Tube | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
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SY100S314JZ TR |
Micrel Inc |
IC LINE RCVR QUINT DIFF 28-PLCC |
Tape & Reel (TR) | 100S | Differential Receiver | 4.2 V ~ 5.5 V | 5 | 0°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC |
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SN74ABTE16246DLG4 |
Texas Instruments |
IC 11BIT I-WS BUS TXRX 48-SSOP |
Tube | 74ABTE | Incident-Wave Switching Bus Transceivers | 4.5 V ~ 5.5 V | 11 | -40°C ~ 85°C | Surface Mount | 48-BSSOP (0.295", 7.50mm Width) | 48-SSOP |
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LM9780CCVS/NOPB |
Texas Instruments |
NON-STANDARD PART CALL FIRST |
Tray | - | - | - | - | - | - | - | - |
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SN74FB2033ARCG3 |
Texas Instruments |
IC REGISTERED TXRX 8BIT 52QFP |
Tray | 74FB | TTL/BTL Registered Transceiver | 4.75 V ~ 5.25 V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
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SN74ABT18502PMR |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Tape & Reel (TR) | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74ABT18502PMRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Tape & Reel (TR) | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74ABT18504PMG4 |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
Tray | 74ABT | Scan Test Device with Universal Bus Transceivers | 4.5 V ~ 5.5 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74LVTH182646APM |
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Tray | 74LVTH | ABT Scan Test Device With Transceivers and Registers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74LVTH18646APMG4 |
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Tray | 74LVTH | ABT Scan Test Device With Transceivers and Registers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74LVTH18652APMG4 |
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Tray | 74LVTH | ABT Scan Test Device With Transceivers and Registers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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74LVTH182646APMG4 |
Texas Instruments |
IC 18BIT TXRX REGISTER 64-LQFP |
Tray | 74LVTH | ABT Scan Test Device With Transceivers and Registers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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74LVTH182652APMG4 |
Texas Instruments |
IC 18BIT TXRX REGISTER 64-LQFP |
Tray | 74LVTH | ABT Scan Test Device With Transceivers and Registers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SY100S815ZH TR |
Micrel Inc |
IC DRIVER QUAD DIFF PECL 16-SOIC |
Tape & Reel (TR) | 100S | Differential Receiver | 4.75 V ~ 5.25 V | 4 | 0°C ~ 85°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC |
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SN74ABTH18646APMG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Tray | 74ABTH | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74ABTH18652APMG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Tray | 74ABTH | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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LM9780CCVS |
Texas Instruments |
NON-STANDARD PART CALL FIRST |
Tray | - | - | - | - | - | - | - | - |
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SN74ABT18646PMG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Tray | 74ABT | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74ABT18652PMG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Tray | 74ABT | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74ABTH182652APM |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Tray | 74ABTH | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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74ABTH182646APMG4 |
Texas Instruments |
IC 18BIT SCAN TEST DEV 64-LQFP |
Tray | 74ABTH | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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74ABTH182652APMG4 |
Texas Instruments |
IC 18BIT SCAN TEST DEV 64-LQFP |
Tray | 74ABTH | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74FB1653PCA |
Texas Instruments |
IC 17BIT UNIV STRG XCVR 100HLQFP |
Tube | 74FB | LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line | 4.5 V ~ 5.5 V | 17 | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) |
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SN74FB1653PCAG4 |
Texas Instruments |
IC STORAGE TXRX UNIV 100-HLQFP |
Tube | 74FB | LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line | 4.5 V ~ 5.5 V | 17 | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) |
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SY58016LMG |
Micrel Inc |
IC LINE DRIVER/RCVR CML 16-MLF |
Tube | SY58 | Differential Receiver/Driver | 3 V ~ 3.6 V | - | -40°C ~ 85°C | Surface Mount | 16-VFQFN Exposed Pad, 16-MLF® | 16-MLF® (3x3) |
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SN74ABT18502PMG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 64LQFP |
Tray | 74ABT | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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SN74FB1650PCA |
Texas Instruments |
IC 18-BIT TTL/BTL XCVR 100-HLQFP |
Tube | 74FB | TTL/BTL Universal Storage Transceiver | 4.5 V ~ 5.5 V | 18 | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) |
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SN74FB1650PCAG4 |
Texas Instruments |
IC STORAGE TXRX UNIV 100-HLQFP |
Tube | 74FB | TTL/BTL Universal Storage Transceiver | 4.5 V ~ 5.5 V | 18 | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) |
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SN74LS294NE4 |
Texas Instruments |
IC PROG FREQ DIV/TIMER 16-DIP |
Tube | 74LS | Programmable Frequency Dividers/Digital Timers | 4.75 V ~ 5.25 V | - | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP |
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SN74LS292NE4 |
Texas Instruments |
IC PROG FREQ DIV/TIMER 16-DIP |
Tube | 74LS | Programmable Frequency Dividers/Digital Timers | 4.75 V ~ 5.25 V | - | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP |
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SN74FB1651PCA |
Texas Instruments |
IC 17-BIT TTL/BTL XCVR 100-HLQFP |
Tube | 74FB | TTL/BTL Universal Storage Transceiver with Buffered Clock Line | 4.5 V ~ 5.5 V | 17 | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) |
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SN74FB1651PCAG4 |
Texas Instruments |
IC UNIV STORAGE TXRX 100TQFP |
Tube | 74FB | TTL/BTL Universal Storage Transceiver with Buffered Clock Line | 4.5 V ~ 5.5 V | 17 | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) |
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SN74LS297N |
Texas Instruments |
IC DIG PLL FILTER 16-DIP |
Tube | 74LS | Digital Phase-Locked-Loop Filters | 4.75 V ~ 5.25 V | - | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP |
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SN74LS297NE4 |
Texas Instruments |
IC DIG PLL FILTER 16-DIP |
Tube | 74LS | Digital Phase-Locked-Loop Filters | 4.75 V ~ 5.25 V | - | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP |
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SN74ACT8990FNR |
Texas Instruments |
IC TEST-BUS CONTROLLER 44-PLCC |
Tape & Reel (TR) | 74ACT | Test Bus Controller | 4.5 V ~ 5.5 V | 16 | 0°C ~ 70°C | Surface Mount | 44-LCC (J-Lead) | 44-PLCC (16.58x16.58) |
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SN74ACT8990FNR |
Texas Instruments |
IC TEST-BUS CONTROLLER 44-PLCC |
Cut Tape (CT) | 74ACT | Test Bus Controller | 4.5 V ~ 5.5 V | 16 | 0°C ~ 70°C | Surface Mount | 44-LCC (J-Lead) | 44-PLCC (16.58x16.58) |
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SN74ACT8990FNR |
Texas Instruments |
IC TEST-BUS CONTROLLER 44-PLCC |
Digi-Reel® | 74ACT | Test Bus Controller | 4.5 V ~ 5.5 V | 16 | 0°C ~ 70°C | Surface Mount | 44-LCC (J-Lead) | 44-PLCC (16.58x16.58) |
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SN74ACT8990FN |
Texas Instruments |
IC TEST-BUS CONTROLLER 44-PLCC |
Tube | 74ACT | Test Bus Controller | 4.5 V ~ 5.5 V | 16 | 0°C ~ 70°C | Surface Mount | 44-LCC (J-Lead) | 44-PLCC (16.58x16.58) |
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MAX19005CCS+ |
Maxim Integrated |
IC DCL QUAD 300MHZ ATE 80TQFP |
Tray | ATE | Comparator, Driver | -1 V ~ 5.2 V | 4 | 0°C ~ 70°C | Surface Mount | 80-TQFP Exposed Pad | 80-TQFP-EP (12x12) |
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MAX19005CCS+T |
Maxim Integrated |
IC DCL QUAD 300MHZ ATE 80TQFP |
Tape & Reel (TR) | ATE | Comparator, Driver | -1 V ~ 5.2 V | 4 | 0°C ~ 70°C | Surface Mount | 80-TQFP Exposed Pad | 80-TQFP-EP (12x12) |
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MAX9967BRCCQ+TD |
Maxim Integrated |
IC DCL DUAL 500MBPS ATE 100TQFP |
Tape & Reel (TR) | ATE | Comparator, Driver | -1.5 V ~ 6.5 V | 2 | 0°C ~ 70°C | Surface Mount | 100-TQFP Exposed Pad | 100-TQFP-EPR (14x14) |
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MAX9967ADCCQ+TD |
Maxim Integrated |
IC DCL DUAL 500MBPS ATE 100TQFP |
Tape & Reel (TR) | ATE | Comparator, Driver | -1.5 V ~ 6.5 V | 2 | 0°C ~ 70°C | Surface Mount | 100-TQFP Exposed Pad | 100-TQFP-EPR (14x14) |
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MAX9967BRCCQ+D |
Maxim Integrated |
IC DCL DUAL 500MBPS ATE 100TQFP |
Tray | ATE | Comparator, Driver | -1.5 V ~ 6.5 V | 2 | 0°C ~ 70°C | Surface Mount | 100-TQFP Exposed Pad | 100-TQFP-EPR (14x14) |
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HEF4007UBT,653 |
NXP Semiconductors |
IC DUAL PAIR/INVERTER 14SOIC |
Tape & Reel (TR) | 4000B | Complementary Pair Plus Inverter | 3 V ~ 18 V | 3 | -55°C ~ 125°C | Surface Mount | 14-SOIC (0.154", 3.90mm Width) | 14-SO |
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HEF4007UBT,652 |
NXP Semiconductors |
IC DUAL PAIR/INVERTER 14SOIC |
Tube | 4000B | Complementary Pair Plus Inverter | 3 V ~ 18 V | 3 | -55°C ~ 125°C | Surface Mount | 14-SOIC (0.154", 3.90mm Width) | 14-SO |
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74AUP1Z04GS,132 |
NXP Semiconductors |
IC XTAL DRIVER LP 6XSON |
Tape & Reel (TR) | 74AUP | Inverter, X-Tal Driver | 0.8 V ~ 3.6 V | - | -40°C ~ 125°C | Surface Mount | 6-XFDFN | 6-XSON, SOT1202 (1x1) |
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74AUP1Z125GS,132 |
NXP Semiconductors |
IC XTAL DRIVER LP 6XSON |
Tape & Reel (TR) | 74AUP | Inverter, X-Tal Driver | 0.8 V ~ 3.6 V | - | -40°C ~ 125°C | Surface Mount | 6-XFDFN | 6-XSON, SOT1202 (1x1) |
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74AUP1Z04GF,132 |
NXP Semiconductors |
IC XTAL DRIVER LP 6-XSON |
Tape & Reel (TR) | 74AUP | Inverter, X-Tal Driver | 0.8 V ~ 3.6 V | - | -40°C ~ 125°C | Surface Mount | 6-XFDFN | 6-XSON, SOT891 (1x1) |
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74AUP1Z125GF,132 |
NXP Semiconductors |
IC DRIVER X-TAL LO-PWR 6-XSON |
Tape & Reel (TR) | 74AUP | Inverter, X-Tal Driver | 0.8 V ~ 3.6 V | - | -40°C ~ 125°C | Surface Mount | 6-XFDFN | 6-XSON, SOT891 (1x1) |
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74HC283PW,112 |
NXP Semiconductors |
IC 4BIT BINAR FULL ADDER 16TSSOP |
Tube | 74HC | Binary Full Adder with Fast Carry | 2 V ~ 6 V | 4 | -40°C ~ 125°C | Surface Mount | 16-TSSOP (0.173", 4.40mm Width) | 16-TSSOP |
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74HC283PW,118 |
NXP Semiconductors |
IC 4BIT BINAR FULL ADDER 16TSSOP |
Tape & Reel (TR) | 74HC | Binary Full Adder with Fast Carry | 2 V ~ 6 V | 4 | -40°C ~ 125°C | Surface Mount | 16-TSSOP (0.173", 4.40mm Width) | 16-TSSOP |
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74AUP1Z04GM,115 |
NXP Semiconductors |
IC XTAL DRIVER LP 6-XSON |
Tape & Reel (TR) | 74AUP | Inverter, X-Tal Driver | 0.8 V ~ 3.6 V | - | -40°C ~ 125°C | Surface Mount | 6-XFDFN | 6-XSON, SOT886 (1.45x1) |
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74AUP1Z04GM,132 |
NXP Semiconductors |
IC XTAL DRIVER LP 6-XSON |
Tape & Reel (TR) | 74AUP | Inverter, X-Tal Driver | 0.8 V ~ 3.6 V | - | -40°C ~ 125°C | Surface Mount | 6-XFDFN | 6-XSON, SOT886 (1.45x1) |
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74AUP1Z125GM,132 |
NXP Semiconductors |
IC XTAL DRIVER LP 6-XSON |
Tape & Reel (TR) | 74AUP | Inverter, X-Tal Driver | 0.8 V ~ 3.6 V | - | -40°C ~ 125°C | Surface Mount | 6-XFDFN | 6-XSON, SOT886 (1.45x1) |
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74HC283D,653 |
NXP Semiconductors |
IC 4BIT BINARY FULL ADDER 16SOIC |
Tape & Reel (TR) | 74HC | Binary Full Adder with Fast Carry | 2 V ~ 6 V | 4 | -40°C ~ 125°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SO |
