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8V182512IDGGREP

Description:
IC ABT SCAN TEST DEV3.3V 64TSSOP
Manufacturer:
Texas Instruments
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8V182512IDGGREP

Product Information

Category
Logic - Specialty Logic
Packaging
Cut Tape (CT)
Series
-
Logic Type
ABT Scan Test Device With Universal Bus Transceivers
Supply Voltage
2.7 V ~ 3.6 V
Number of Bits
18
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
64-TFSOP (0.240", 6.10mm Width)
Supplier Device Package
64-TSSOP

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