8V18646AIPMREP
- Description：
- IC ABT SCAN TEST DEV 3.3V 64LQFP
- Manufacturer：
- Texas Instruments
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Product Information
- Category
- Interface - Specialized
- Packaging
- Cut Tape (CT)
- Series
- SCOPE™, Widebus™
- Applications
- Circuit Board Testing
- Interface
- 4-Wire Test Access Port (TAP)
- Voltage - Supply
- 2.7 V ~ 3.6 V
- Package / Case
- 64-LQFP
- Supplier Device Package
- 64-LQFP (10x10)
- Mounting Type
- Surface Mount
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